– W. Ciccognani, S. Colangeli, A. Serino, L. Pace, S. Fenu, P. E. Longhi, E. Limiti, J. Poulain, R. Leblanc, “Comparative noise investigation of high-performance GaAs and GaN millimeter-wave monolithic technologies,” 14th Eur. Microw. Integr. Circuits Conf., pp. 1–4, Paris, 29 September – 4 October 2019.
DOI: http://dx.doi.org/10.23919/EuMIC.2019.8909484.
– L. Pace, W. Ciccognani, S. Colangeli, P. E. Longhi, E. Limiti, and R. Leblanc, “A Ka-Band Low-Noise Amplifier for Space Applications in a 100 nm GaN on Si technology,” PRIME 2019 – 15th Conf. Ph.D. Res. Microelectron. Electron. Proc., pp. 161–164, Lausanne, 15-18 July 2019.
DOI: http://dx.doi.org/10.1109/PRIME.2019.8787800.
– G. Polli, P. E. Longhi, S. Colangeli, S. Fenu, F. Costanzo, W. Ciccognani, E. Limiti, “GaN/Si ka-band SPDT for observation payloads,” in Asia-Pacific Microwave Conference Proceedings, APMC, Singapore, 10-13 December 2019, vol. 2019-Decem, no. 776322, pp. 288–290.
DOI: http://dx.doi.org/10.1109/APMC46564.2019.9038632.
– S. Colangeli, W. Ciccognani, A. Serino, P. E. Longhi, L. Pace, J. Poulain, R. Leblanc, E. Limiti, “Nondestructive, Self-Contained Extraction Method of Parasitic Resistances in HEMT Devices,” IEEE Trans. Microw. Theory Tech., vol. 68, no. 7, pp. 2571–2578, 2020.
DOI: http://dx.doi.org/10.1109/TMTT.2020.2988665.
– P. E. Longhi, S. Colangeli, W. Ciccognani, L. Pace, R. Leblanc, and E. Limiti, “C to V-band cascode distributed amplifier design leveraging a double gate length gallium nitride on silicon process,” IEEE MTT-S Int. Microw. Symp.(IMS) Dig., vol. 2020-August, pp. 409–412, 2020.
DOI: http://dx.doi.org/10.1109/IMS30576.2020.9223842.
– L. Pace, S. Colangeli, W. Ciccognani, P. E. Longhi, E. Limiti, R. Leblanc, M. Feduale, F. Vitobello, “Design and validation of 100 nm GaN-On-Si Ka-Band LNA based on custom noise and small signal models,” MDPI Electronics, vol. 9, no. 1, p. 150, 2020.
DOI: http://dx.doi.org/10.3390/electronics9010150.
– L. Pace, F. Costanzo, P. E. Longhi, W. Ciccognani, S. Colangeli, A. Suriani, R. Leblanc, E. Limiti, “Design of a Ka-band Single-Chip Front-End based on a 100 nm GaN-on-Si technology,” 2020 Int. Work. Integr. Nonlinear Microw. Millimetre-Wave Circuits, INMMiC 2020 – Proc., pp. 2020–2022, 2020.
DOI: http://dx.doi.org/10.1109/INMMiC46721.2020.9160306.
– S.Colangeli, W. Ciccognani, P. E. Longhi, L. Pace, J. Poulain, R. Leblanc, E. Limiti, “Linear Characterization and Modeling of GaN-on-Si HEMT Technologies with 100 nm and 60 nm Gate Lengths”, MDPI Electronics, Vol.10, n°1, 134, January 2021, pp.1-17.
DOI: http://dx.doi.org/10.3390/electronics10020134.
– L.Pace, P.E. Longhi, W. Ciccognani, S. Colangeli, R. Leblanc, E. Limiti, “A MMIC Low-Noise Amplifier realized with two different gate length GaN-on-Si technologies”, 50th Eur. Microw. Conf. (EUMC 2020), 10-15 January 2021, pp.1023-126.
DOI: http://dx.doi.org/10.23919/EuMC48046.2021.9338196.
– P.E.Longhi, L.Pace, S.Colangeli, W.Ciccognani, E.Limiti, “Novel design charts for optimum source degeneration trade-off in conjugately-matched multistage low-noise amplifiers,” IEEE Transactions on Microwave Theory and Techniques, Vol.69, n°5, May 2021, pp.2531-2540.
DOI: http://dx.doi.org/10.1109/TMTT.2021.3068285.
– S.Colangeli, W.Ciccognani, P.E.Longhi, L.Pace, A.Serino, J.Poulain, R.Leblanc, E.Limiti, “Source/Load-Pull Noise Measurements at Ka Band,” Energies, Vol.14, n°9, 5615, September 2021, pp.1-15.
DOI: http://dx.doi.org/10.3390/en14185615.
– F.Costanzo, L.Pace, P.E.Longhi, W.Ciccognani, S.Colangeli, R.Leblanc, E.Limiti, “A derating-rules compliant Ka-Band GaN-on-Si power amplifier designed for highly reliable satellite applications,” Proceedings of the 51th European Microwave Conference (EuMC), London, United Kingdom, 3rd – 4th April 2022, pp.253-256.
DOI: http://dx.doi.org/10.23919/EuMIC50153.2022.9783911.
– P.E.Longhi, F.Costanzo, L.Pace, W.Ciccognani, S.Colangeli, R.Giofrè, R.Leblanc, F.Vitobello, E.Limiti, “GaN-on-Si Ka-band Single-Chip Front-End MMIC for Earth Observation Payloads,” Proceedings of the 2022 IEEE International Microwave Symposium Digest (IMS 2022), Denver, CO, USA, 19th – 24th June 2022, pp.456-459.
DOI: http://dx.doi.org/10.1109/IMS37962.2022.9865456.